Simple Testing

Simple Testing according to Customers’ testing files

Well-executed tests ensure a well-designed product can be successfully launched and achieve the fullest potential in the market.

Whether you require a PCB Assembly test only or a full suite of system tests, our team of engineers has extensive experience in developing and implementing integrated test strategies and cost effective tests for each assembly to significantly enhance your product reliability and to ensure only fully tested products are delivered to your and your clients.

HP TestJet Technology

TestJet Technology is the most widely used vectorless test technology in the world because it reliably identifies opens around (and inside) almost any IC package with a lead frame or metallic pins or leads to which the TestJet probe can capacitively couple–an enormous variety of device types.

ICT (In-Circuit Test)

In-Circuit Testing, ICT is a method of testing which helps detect defective components by using an electrical probe to check components at individual points. ICT checks for shorts, opens, resistance, capacitance, and other basic quantities which will flag any discrepancies. This fully automated test allows the techs to replace any faulty parts and thus move it along to QC for approval before its end use. In-circuit tests are usually conducted in two parts, such as Power-off Tests and Power-on Tests. As the name implies, in Power-off Tests, tests are conducted before power is applied and in the second part, tests are performed after power is applied.

Burn-in testing

Burn-in is a process done to components prior to regular use, in which the components are stressed to detect failure and ensure component reliability.
The PCB burn-in process is usually done at 125ºC, with electrical excitation applied to the samples. The process is facilitated by using burn-in boards where the samples are loaded. These boards are then inserted into the burn-in oven, which supplies the necessary voltages to the samples while maintaining the oven temperature at 125ºC. The electrical bias applied may either be static or dynamic.

Functional testing (FCT)

Functional testing usually is performed after the circuit boards are assembled and AOI & visual inspections are finished. Early testing allows us to find and correct component failures, assembly defects or potential design issues at an early stage and make troubleshooting as quick as possible. Finally, customers can deliver a perfect product to their clients in a short time frame. Functional testing is done mainly to avoid assembly issues including shorts, opens, missing components or the installation of incorrect parts.

ESS (Environmental Stress Screening)

Environmental stress screening (ESS) is a process where new or repaired electronic components are placed in a testing chamber and exposed to thermal cycling, vibration, and other environmental stresses. The purpose of ESS is to force the manifestation of latent mechanical defects that result in permanent or catastrophic failure of the component. This testing helps ensure the quality, functionality, and reliability of electronic hardware and components during shipping, storage, and use. PCB environmental stress testing is typically conducted during the design and development stages, and after the components are installed in electronic equipment.
We use a large, in-house, temperature- and humidity-controlled chamber to perform environmental test screenings. Tested components are run through several cycles of rapidly fluctuating temperature and condensing or non-condensing humidity, with dwells at both high and low extremes. This simulates the range of environmental conditions that the tested devices will be subject to, allows us to determine whether our products are doing what our customers expect.

HALT (Highly Accelerated Life Test)

Product reliability is essential to success in today's competitive global market. Highly accelerated life testing (HALT) is an intensive method used to expose design and process weaknesses, allowing you to improve them prior to product launch. Because of its accelerated nature, HALT testing is faster, less expensive, and more accurate than traditional testing techniques.
The test can accelerate a product's aging process from actual months into test minutes, much faster than traditional testing. HALT testing is designed to help you discover weaknesses in your product during the design stage, uncovering design or manufacturing process flaws before they reach your customer.

HASS (Highly Accelerated Stress Screening)

HALT testing is typically employed during the design or development stages of a product life cycle. HASS testing is slightly different, because its purpose is to speed the discovery of latent defects in manufacturing during the production stages of a product life cycle to reduce associated failures. The HASS process utilizes similar equipment to the HALT process, and the development of a usable HASS profile requires previous HALT results as well as other data and related validation information. In addition to identifying defects in existing products, HASS testing can also determine the impact that alternative components will have on your product design and durability.